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Failure Analysis

Printed Circuit boards, Electronic sub-assemblies, microelectronics ; DPA (destructive physical analysis).  Our experience allows us to maintain turn-around time of a few days to help you solve problems quickly. 

Surface Dendrite Growth

Surface Dendrite Growth

Metallic crystal growth from one electrical potential to another is caused by surface contamination on a printed circuit board.  The example to the left became visible at medium power under specific lighting conditions.

Electrical & Physical Analysis:

  • Analysis of mechanical & electronic components
  • Die passivation, metallization, oxide, and polysilicon layers
  • Optical & Scanning Electron Microscope
  • Decapsulation to reveal internal construction/defects
  • Electrical testing per specification
  • Radiography (X-Ray)
  • Die probing
  • Sonoscan

Inner Layer Dendrite Growth

Another crystal growth, common in PCB manufacture, is between traces.  The above picture shows three different scales of the same board with this problem.  Commonly the condition is due to a contaminant between the traces.

Destructive Analysis per Military/Industry Standards:

  • External visual
  • Bond strength (Wire pull)
  • Solvent resistance
  • Die shear
  • Solderability
  • SEM metallization
  • Internal water vapor content (Residual gas analysis)
  • Energy Dispersive X-Ray Analysis (EDX)
  • Lead integrity & tensile strength
  • Fine & gross leak (Hermeticity)
  • Internal visual
  • Baseline analysis
  • Microsectioning
 
Dull Bit 1

Dull Drill Bit

A dull drill bit during fabrication has pressed some excess material onto the ground plane.  This material was then plated over, causing a faulty plated thru hole.

Dull Drill Bit

A dull drill bit during fabrication has caused delamination. The cavity was consequently filled with a contaminant.  After plating, when the board was heated, the contaminant outgassed, causing the plating to fracture and produce an open thru hole.

Dull Bit 2
Plating Error

Material Analysis:

Plating error

This board was immersed for too short a period of time in the plating process.  The result is an open from the top to bottom.

 

  • Quality assessment of PC boards and assemblies
  • Metallurgical microsectioning analysis of materials
  • Quality assessment of connectors
  • Plating thickness measurements
  • Fatigue and fracture analysis
  • Identification of microstructures
  • Plating quality assessment analysis
  • Identification of contaminants and materials
  • Corrosion analysis
  • X-Ray fluorescence
  • Cleanliness testing of PC assemblies
  • FTIR